Reliability Test Data

Tech Notes

Reliability Test Data

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Classification	Test Item	Reference Standard	Test Conditions	Result
Endurance Test	Operation Life	MIL-STD-750:1026 MIL-STD-883:1005 JIS C 7021 :B-1	Connect with a power lf = 30mA Ta = Under room temperature Test time = 1,000 hrs	0/100
	High Temperature High Humidity Storage	MIL-STD-202:103B JIS C 7021 :B-11	Ta= 85°C ± 5°C RH = 90% - 95% Test time = 1,000 hrs	0/100
	High Temperature Storage	MIL-STD-883:1008 JIS C 7021 :B-10	High Ta = 105°C ± 5°C Test time = 1,000 hrs	0/100
	Low Temperature Storage	JIS C 7021 :B-12	Low Ta = -55°C ± 5°C Test time = 1,000 hrs	0/100
Environmental Test	Temperature Cycling	MIL-STD-202:107D MIL-STD-750:1051 MIL-STD-883:1010 JIS C 7021 :A-4	-55°C ~25°C ~105°C ~25°C 30 min 5 min 30 min 5 min Test time = 10 cycle	0/100
	Thermal Shock	MIL-STD-202:107D MIL-STD-750:1051 MIL-STD-883:1011	105°C ± 5°C ~-55°C ± 5°C 10 min 10 min Test time = 10 cycle	0/100
	Solder Resistance	MIL-STD-202:201A MIL-STD-750:2031 JIS C 7021 :A-1	T.sol = 260 ± 5°C Dwell time = 10 ± 1 sec	0/50
	Solderability	MIL-STD-202:208D MIL-STD-750:2026 MIL-STD-883:2003 JIS C 7021 :A-2	T.sol = 230 ± 5°C Dwell time = 5 ± 1 sec	0/50
	Lead Bending Stress	MIL-STD-750:2036 JIS C 7021 :A-11	0° ~90° ~0° bend, 3 cycles Weight 250g	0/50

Criteria of Failure for the Reliability

Measuring Items	Symbol	Measuring Conditions	Judgment Criteria for Failure
Forward voltage	Vf	lf = 20mA	Over Ux1.2
Reverse current	Ir	Vr = 5V	Over Ux2
Luminous intensity	Iv	If = 20mA	Below Sx0.5

MTBF:		100,000 hrs

Note:	1.	U, means the upper limit of specified characteristics. S, means initial value.
	2.	Measurement shall be taken between 2 hours and after the test pieces have been returned to normal ambient conditions after completion of each test.
	3.	Ta, means temperature applied.
	4.	RH, means relative humidity.
	5.	T.sol, means solder temperature.