Discrete & PCB LED Lamps
Reliability Test Data
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Classification Test Item Reference Standard Test Conditions

Result

Endurance Test Operation Life MIL-STD-750:1026
MIL-STD-883:1005
JIS C 7021   :B-1		 Connect with a power lf = 30mA
Ta = Under room temperature
Test time = 1,000 hrs		 0/100
High Temperature High Humidity Storage MIL-STD-202:103B
JIS C 7021   :B-11		 Ta= 85°C ± 5°C
RH = 90% - 95%
Test time = 1,000 hrs		 0/100
High Temperature Storage MIL-STD-883:1008
JIS C 7021   :B-10		 High Ta = 105°C ± 5°C
Test time = 1,000 hrs		 0/100
Low Temperature Storage JIS C 7021   :B-12 Low Ta = -55°C ± 5°C
Test time = 1,000 hrs		 0/100
Environmental Test Temperature Cycling MIL-STD-202:107D
MIL-STD-750:1051
MIL-STD-883:1010
JIS C 7021   :A-4		 -55°C ~25°C ~105°C ~25°C
  30 min  5 min  30 min  5 min
Test time = 10 cycle		 0/100
Thermal Shock MIL-STD-202:107D
MIL-STD-750:1051
MIL-STD-883:1011		 105°C ± 5°C ~-55°C ± 5°C
10 min            10 min
Test time = 10 cycle		 0/100
Solder Resistance MIL-STD-202:201A
MIL-STD-750:2031
JIS C 7021   :A-1		 T.sol = 260 ± 5°C
Dwell time = 10 ± 1 sec		 0/50
Solderability MIL-STD-202:208D
MIL-STD-750:2026
MIL-STD-883:2003
JIS C 7021   :A-2		 T.sol = 230 ± 5°C
Dwell time = 5 ± 1 sec		 0/50
Lead Bending Stress MIL-STD-750:2036
JIS C 7021   :A-11		 0° ~90° ~0° bend, 3 cycles
Weight 250g		 0/50

Criteria of Failure for the Reliability

Measuring Items Symbol Measuring Conditions Judgment Criteria for Failure
Forward voltage Vf lf = 20mA Over Ux1.2
Reverse current Ir Vr = 5V Over Ux2
Luminous intensity Iv If = 20mA Below Sx0.5
MTBF: 100,000 hrs
Note: 1. U, means the upper limit of specified characteristics.  S, means initial value.
2. Measurement shall be taken between 2 hours and after the test pieces have been returned to normal ambient conditions after completion of each test.
3. Ta, means temperature applied.
4. RH, means relative humidity.
5. T.sol, means solder temperature.